Tantalum

Tantalum — Material Page
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Tantalum (Ta, atomic number 73) is a Group 5 refractory metal with a BCC crystal structure, a melting point of 3,017 °C (fourth-highest of any element), density of 16.69 g/cm³, and the most corrosion-resistant of all refractory metals — it is inert to virtually all acids below 150 °C including hydrochloric, sulfuric, and nitric acid, and is only attacked by hydrofluoric acid, fuming sulfuric acid, and hot concentrated alkalis. Tantalum is a relatively rare element (~2 ppm crustal abundance), obtained primarily from the mineral coltan (columbite-tantalite, (Fe,Mn)(Nb,Ta)₂O₆), with the Democratic Republic of Congo, Rwanda, and Australia as principal sources; Ta is chemically inseparable from Nb in its ores and must be separated by solvent extraction or fluoride fractional crystallization. Ta is ductile and cold-workable without annealing — an unusual property among refractory metals (W and Mo are brittle at room temperature) — reflecting its BCC structure with sufficient room-temperature slip systems and no ductile-to-brittle transition above ~–200 °C. Global production is ~2,000 tonnes/year, making Ta one of the rarest metals in commercial use; its conflict-mineral status (DRC sourcing) has driven significant supply chain due-diligence requirements (OECD guidelines, Dodd-Frank Section 1502).

The dominant application of tantalum — consuming ~60% of global production — is in tantalum electrolytic capacitors, which exploit the high dielectric constant of anodically grown Ta₂O₅ (εᵣ ~27) to achieve the highest volumetric capacitance of any capacitor technology, enabling miniaturization critical to portable electronics. Tantalum capacitors are made from sintered Ta powder anodes (high surface area, ~50,000–200,000 µF·V/g charge/weight figure of merit) with a thin anodically grown Ta₂O₅ dielectric and a MnO₂ or conductive polymer cathode; they are essential in smartphones, hearing aids, implantable medical devices, and military/aerospace electronics where high capacitance in a small package with stable performance over wide temperature ranges is required. A key failure mode is the incendiary short-circuit failure of Ta capacitors with MnO₂ cathodes — this drove development of polymer (PEDOT) cathode Ta capacitors (fail-safe short, lower ESR) as a safer alternative. Tantalum carbide (TaC, mp 3,983 °C) and Ta-Hf-C alloys have the highest melting points of any known material, making Ta compounds important in ultra-high temperature ceramic (UHTC) research.

Tantalum's exceptional biocompatibility — superior to titanium in some assessments, with no known biological role and essentially zero ion release in physiological conditions — makes it the premium material for permanent implants where longevity and MRI compatibility are paramount. Ta is used in trabecular metal (porous Ta scaffolds with ~80% porosity mimicking cancellous bone, produced by CVD of Ta onto reticulated vitreous carbon foam) for spinal fusion cages, acetabular cups, and tibial components; in Ta wire/clips for surgical marking and vessel ligation; and as a radiopaque marker in catheters and guidewires. In the semiconductor industry, Ta and TaN thin films deposited by PVD or ALD are the standard diffusion barriers between Cu interconnects and the dielectric in back-end-of-line (BEOL) processing — preventing Cu diffusion into SiO₂/low-κ dielectrics that would cause transistor failure — in every Cu-interconnect IC produced since the late 1990s.

General Properties

PropertyValueNotes
Atomic Number73Group 5, Period 6; 4f¹⁴5d³6s² electron configuration. Dominant oxidation state +5 (Ta₂O₅, TaCl₅, tantalates); +3 and +4 occur in lower halides and organometallic compounds. Sits directly below Nb (group 5, Period 5) with nearly identical ionic radius due to the lanthanide contraction, causing their inseparability in ores.
Atomic Mass180.948 uTwo naturally occurring isotopes: ¹⁸¹Ta (99.988%, stable) and ¹⁸⁰ᵐTa (0.012%, the only naturally occurring nuclear isomer). The monoisotopic-like dominance of ¹⁸¹Ta simplifies ICP-MS analysis; ¹⁸¹Ta(n,γ)¹⁸²Ta (σ = 20.5 barn) is used for neutron activation analysis.
Density (20 °C)16.69 g/cm³High density — comparable to Re (21.0), W (19.3), and Os (22.6); significantly denser than Nb (8.57 g/cm³) despite being in the same group, due to the lanthanide contraction. The high density is relevant in radiation shielding applications where Ta sheet provides significant X-ray/gamma attenuation.
Melting Point3,017 °C (3,290 K)The source intro states 2,996 °C and the table 3,020 °C — the accepted NIST value is 3,017 °C. Fourth-highest melting point of any element after C (~3,550 °C sublimation), W (3,422 °C), and Re (3,186 °C).
Boiling Point5,457 °C (5,730 K)Very high boiling point ensures negligible Ta evaporation during high-temperature processing, vacuum furnace operation, and PVD sputtering target use.
Thermal Conductivity57.5 W/m·KModerate thermal conductivity for a refractory metal — lower than W (173 W/m·K) and Mo (138 W/m·K) but adequate for heat spreader and furnace component applications. Ta's thermal conductivity changes little with temperature up to ~1,500 °C.
Electrical Resistivity130 nΩ·m (20 °C)Higher resistivity than Cu (17 nΩ·m) but relevant for thin-film resistance applications. The β-Ta phase (metastable tetragonal, formed in thin films at low deposition temperatures) has much higher resistivity (~170–210 nΩ·m) than α-Ta (BCC, ~130 nΩ·m) — phase control during PVD deposition is critical for Ta diffusion barrier and resistor applications.
Crystal Structureα-Ta: BCC, a = 3.301 Å (stable); β-Ta: tetragonal (metastable thin-film phase)α-Ta (BCC) is the stable bulk form; β-Ta (tetragonal σ-phase) forms in thin films deposited below ~300 °C and has ~60% higher resistivity — a critical distinction for semiconductor diffusion barrier and thin-film resistor applications where phase must be controlled by deposition temperature and seed layer.

Mechanical Properties

PropertyValueNotes
Tensile Strength140–275 MPa (annealed–cold-worked)Wide range reflecting work hardening — annealed Ta is soft and ductile (~140 MPa TS, ~50% elongation); cold-worked Ta can reach 275+ MPa with reduced ductility. Ta can be cold-rolled to thin foil without intermediate annealing.
Yield Strength110–250 MPaLow yield strength in annealed condition enables forming at room temperature — unusual for a refractory metal. No ductile-to-brittle transition (DBTT) above ~–200 °C, unlike W and Mo which are brittle at room temperature in non-purified forms.
Young's Modulus186 GPaHigh stiffness consistent with a refractory BCC metal; isotropic in polycrystalline form. Used in finite element models of Ta capacitor anode sintering and Ta MEMS resonator design.
Hardness150–200 HV (annealed–cold-worked)Moderate hardness — softer than W (3,430 HV) and Mo (1,530 HV), allowing machining with conventional tooling (though carbide tools preferred). Ta work-hardens significantly; anneal at ~1,200 °C in vacuum to restore ductility.
Elongation at Break20–50%Excellent ductility for a refractory metal — comparable to austenitic stainless steel. Enables drawing to wire, rolling to foil, and deep drawing of chemical process equipment without cracking.
Poisson's Ratio0.34Typical for BCC transition metals; used in stress modeling of Ta thin films and Ta-lined chemical reactor vessels.

Chemical Properties

PropertyValue / BehaviorNotes
Oxidation States+5 (dominant); +3, +4 in halides and organometallicsTa₂O₅ is the thermodynamically stable oxide; dielectric constant εᵣ ~27, bandgap ~4.2 eV. Anodically grown Ta₂O₅ forms at ~1.6 nm/V, enabling precise capacitor dielectric thickness control by formation voltage.
Corrosion ResistanceExceptional; resistant to HCl, H₂SO₄, HNO₃, aqua regia below ~150 °C; attacked by HF and hot concentrated alkalisThe most corrosion-resistant refractory metal — more resistant than Pt to many acids. Used as lining for HCl and H₂SO₄ reactors and heat exchangers. Attacked by HF (forms TaF₅), by hot NaOH/KOH, and by liquid metals (Na, Li) at elevated temperatures.
BiocompatibilityExcellent; no known biological role; negligible ion release in physiological conditions; MRI-compatibleTa is considered more biocompatible than Ti in some clinical assessments — zero inflammatory response in long-term implant studies. Non-ferromagnetic (paramagnetic, low susceptibility) — fully MRI-compatible with no significant image artifact. ISO 10993 biocompatibility certified for implant use.
IdentifierValue
SymbolTa
Atomic Number73
CAS Number7440-25-7
UN NumberUN3089 (tantalum powder)
EINECS Number231-135-5
IsotopeTypeNotes
¹⁸⁰ᵐTa Stable* 0.012% natural abundance; I = 9; Stable* — ¹⁸⁰ᵐTa is the only naturally occurring nuclear isomer and the longest-lived nuclear isomer known, with a measured lower limit on its half-life of >10¹⁵ yr (effectively stable on any geological timescale). Its existence in nature is anomalous — all other nuclear isomers decay within hours to years — and is explained by its high spin (I = 9) making gamma decay to the I = 1 ground state highly forbidden. ¹⁸⁰ᵐTa is the rarest stable (or quasi-stable) nuclide in nature.
¹⁸¹Ta Stable 99.988% natural abundance; I = 7/2, NMR-active (large quadrupole, broad lines in solids). ¹⁸¹Ta(n,γ)¹⁸²Ta (σ = 20.5 barn) produces ¹⁸²Ta (t½ = 114.7 days, 1,121/1,189/1,221 keV gammas) used in industrial radiography and neutron activation analysis for Ta determination in geological samples and alloys.

Scientific & Research Applications

Use CaseForm Typically UsedDescription
Ta / TaN Diffusion Barriers (Semiconductors)Ta sputtering targets (99.99–99.999%), ALD Ta precursors (TBTDET, TaCl₅)Ta and TaN thin films (5–10 nm) are the standard Cu diffusion barriers in BEOL interconnects for all Cu-metallized ICs since ~1997. α-Ta (BCC) seed layers promote Cu(111) texture for electromigration resistance; TaN acts as the primary diffusion barrier. Phase control (α vs. β-Ta) requires deposition temperature and substrate optimization.
Tantalum Capacitor ResearchTa powder (high CV/g, 99.97%+), Ta wire leadsResearch focuses on increasing CV/g (charge/weight) of Ta powder anodes beyond 200,000 µF·V/g via nanoporous morphology, improving polymer cathode (PEDOT) performance for lower ESR, and developing Ta capacitor reliability models for medical implant applications (lifetimes >10 years in vivo).
Trabecular Metal ImplantsPorous Ta (CVD-coated reticulated vitreous carbon, ~80% porosity, 99.9%+ Ta)Trabecular metal (Zimmer Biomet) is a porous Ta scaffold with interconnected pores of 400–600 µm mimicking cancellous bone, produced by CVD of Ta onto a carbon foam template. Used for spinal fusion cages, revision hip/knee acetabular components, and tibial trays; bone ingrowth and vascularization occurs within the pores.
Ultra-High Temperature CeramicsTaC powder (99.9%), Ta₄HfC₅ composite precursorsTaC (mp 3,983 °C) and the Ta₄HfC₅ solid solution (>4,000 °C) are among the highest-melting compounds known, studied for hypersonic vehicle leading edges, rocket nozzle inserts, and plasma-facing components. Ta is also added to SiC and ZrB₂ UHTC matrices to improve oxidation resistance above 2,000 °C.
High-Temperature Furnace ComponentsTa sheet, rod, wire (99.9–99.95%), Ta cruciblesTa crucibles and heating elements are used in vacuum furnaces for melting rare earth metals, actinides, and refractory oxides above the Mo limit (~1,800 °C). Ta is compatible with many molten metals and oxides that attack W or Mo, and can be used in reducing atmospheres to ~2,500 °C.

Industrial & Commercial Applications

SectorForm / Grade UsedDescription
Tantalum Electrolytic CapacitorsTa powder (high CV/g, 99.97%+), Ta wire, Ta sheet for wet slug capacitorsTa capacitors dominate high-reliability capacitor markets — ~60% of Ta production. Sintered Ta powder anodes (surface area ~1–5 m²/g) are anodized to grow Ta₂O₅ dielectric, then coated with MnO₂ or PEDOT cathode. Used in smartphones, hearing aids, implantable defibrillators, and aerospace/military electronics requiring stable capacitance from –55 to +125 °C.
Chemical Processing EquipmentTa sheet/plate/tubing (99.9–99.95%), Ta-lined fittingsTa is the material of choice for corrosion-resistant linings of HCl and H₂SO₄ reactors, heat exchangers, bayonet heaters, and distillation columns handling aggressive acids at temperatures up to 150 °C. Its corrosion rate in boiling 98% H₂SO₄ is <0.025 mm/year — comparable to glass-lined equipment but with far greater mechanical strength.
Superalloy Additions (Aerospace)Ta metal (99.9%) as superalloy addition; typically 2–8 wt% in Ni single-crystal alloysTa additions to 3rd-generation single-crystal Ni superalloys (CMSX-4: 6% Ta, René N6: 7% Ta) partition strongly to the γ′ Ni₃(Al,Ta) phase, increasing γ′ lattice parameter mismatch and improving high-temperature creep strength above 1,000 °C. Ta also improves oxidation resistance by stabilizing the γ/γ′ microstructure.
Sputtering Targets (Electronics)Ta targets (99.99–99.999%), bonded to Cu backing platesTa sputtering targets are consumed in large quantities for BEOL diffusion barrier deposition in semiconductor fabs (~200–300 mm targets, rotary or planar), for Ta₂O₅ high-κ dielectric deposition (reactive sputtering in O₂), and for decorative/hard Ta-based coatings on cutting tools and wear surfaces.
PurityMain Use
99.9% (3N)Standard commercial grade for chemical process equipment (acid reactors, heat exchangers), vacuum furnace components (crucibles, heating elements), surgical implants (trabecular metal scaffolds, wire clips), and superalloy additions where <1,000 ppm metallic impurities are acceptable
99.95% (3N5)High-purity grade for capacitor-grade Ta sheet/wire, chemical processing requiring tighter impurity control, and structural Ta components in demanding corrosive environments
99.99% (4N)Advanced electronics sputtering targets for Ta/TaN BEOL diffusion barriers, Ta₂O₅ dielectric deposition, and research applications requiring <100 ppm total metallic impurities
99.995% (4N5)Critical semiconductor sputtering targets for leading-edge nodes (<7 nm), high-purity Ta capacitor powder for implantable medical device capacitors, and aerospace applications with strict material qualification requirements
99.999% (5N)Highest-purity Ta for fundamental research, quantum device substrates, precision thin-film resistors, and applications requiring <10 ppm total metallic impurities
Synonym / Alternative NameContext
TaChemical symbol; from Tantalus of Greek mythology — named by Anders Gustaf Ekeberg (1802) who found it impossible to dissolve Ta₂O₅ in acid, alluding to Tantalus's eternal frustration; the symbol also reflects the difficulty of separating Ta from Nb in ore processing.
Tantalum metalCommercial designation for elemental Ta in sheet, rod, wire, powder, or target form; used in ASTM B364/B365/B521/B708 standards, supply chain documentation, and conflict-mineral reporting (OECD due diligence guidelines for DRC-sourced Ta).
Elemental TantalumUsed in scientific and regulatory literature to distinguish the element from tantalum compounds (Ta₂O₅, TaC, TaN, TaCl₅); common in materials science publications on refractory metals and capacitor technology.
TantaliumArchaic/alternative spelling occasionally seen in older literature and some non-English scientific texts; not the IUPAC-recommended name but preserved in some German-language sources (Tantal is the standard German name).
Element 73Used in nuclear physics and radiochemistry contexts, particularly in discussions of ¹⁸⁰ᵐTa nucleosynthesis and the anomalous survival of the ground-state isomer in stellar environments.